Title :
A model for the analysis of the fault injection process
Author :
Steininger, A. ; Schweinzer, H.
Author_Institution :
Dept. for Electr. Meas. Technol., Tech. Univ. Wien, Austria
Abstract :
Results of fault injection experiments performed under different conditions can only be related to each other, if their interpretation is based on a thorough understanding of activation and propagation of faults and errors. We analyze these processes by applying a special layer model of a computing system. Our aim is to model the transformation of a fault on a signal line into a system failure as the propagation of erroneous information through multiple layers. Two specific layers that describe the fault activation process have been sufficiently completed and are presented here. A quantification for these is derived and different applications are summarized. Excellent correspondence between analytical results based on modeling and experimental data is found. A prediction of fault activation with high accuracy is possible, as well as a quantitative evaluation of the effect of synchronizing fault injection.<>
Keywords :
fault tolerant computing; activation; fault injection process; faults propagation; special layer model; synchronizing fault injection; system failure; Analog computers; Computer errors; Contracts; Electric variables measurement; Error analysis; Fault detection; Fault diagnosis; Hardware; Terminology;
Conference_Titel :
Fault-Tolerant Computing, 1995. FTCS-25. Digest of Papers., Twenty-Fifth International Symposium on
Conference_Location :
Pasadena, CA, USA
Print_ISBN :
0-8186-7079-7
DOI :
10.1109/FTCS.1995.466984