• DocumentCode
    3338635
  • Title

    Development of lead chalcogenide nanocrystalline (NC) semiconductor ionizing radiation detectors

  • Author

    Kim, Geehyun ; Hammig, Mark D.

  • Author_Institution
    Nucl. Eng. & Radiol. Sci. Dept., Univ. of Michigan, Ann Arbor, MI, USA
  • fYear
    2009
  • fDate
    Oct. 24 2009-Nov. 1 2009
  • Firstpage
    1317
  • Lastpage
    1320
  • Abstract
    Nanocrystalline (NC) semiconductor materials exhibit exploitable properties - such as tunable energy band gap, and charge carrier multiplication - which arise due to the strong quantum confinement effect. If the highly uniform multiplicities of excitons can be developed across macroscopic NC samples, then one can potentially quench the statistical counting noise associated with charge carrier creation in the bulk material. Lead chalcogenide (PbSe and PbTe) NC particles of different sizes and shapes were synthesized by changing the reaction conditions and their characterization is reported. Closely packed NC assemblies of PbSe were formed by drop-casting the NC dispersion on various metal contacts, making use of its self-agglomerating nature. Current-voltage (I-V) characteristics of the NC assembly were studied to evaluate its property as an NC assembly diode, followed by an alpha particle impingement experiment from the Am-241 source. The viability and continuing empirical challenges of using lead chalcogenide NC materials as a basis for the detection of ionizing radiation are discussed.
  • Keywords
    alpha-particle sources; excitons; lead compounds; nanostructured materials; semiconductor counters; Am-241 source; NC assembly diode; NC dispersion; Nanocrystalline semiconductor materials; alpha particle impingement experiment; bulk material; charge carrier creation; charge carrier multiplication; current-voltage characteristics; drop-casting; excitons; lead chalcogenide nanocrystalline semiconductor ionizing radiation detectors; macroscopic NC samples; quantum confinement effect; reaction conditions; self-agglomerating nature; statistical counting noise; tunable energy band gap; uniform multiplicities; Assembly; Charge carriers; Ionizing radiation; Lead compounds; Nanostructured materials; Photonic band gap; Potential well; Radiation detectors; Semiconductor materials; Semiconductor radiation detectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-3961-4
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2009.5402345
  • Filename
    5402345