• DocumentCode
    3338900
  • Title

    The study for substrate temperature effects on thermoelectric properties of the amorphous Si-Ge-Au thin films

  • Author

    Miyata, Akiko ; Sato, Yoshikazu ; Okamoto, Yoichi ; Kawahara, Toshio ; Morimoto, Jun

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Nat. Defense Acad., Kanagawa, Japan
  • fYear
    2002
  • fDate
    25-29 Aug. 2002
  • Firstpage
    442
  • Lastpage
    445
  • Abstract
    The control of thermoelectric properties is attempted by changing the, substrate temperature. Amorphous thin films were prepared by the alternate deposition of Si and Ge doped heavily with Au in ultrahigh vacuum chamber. The temperature dependence of electrical resistivity of the sample deposited at 600 K has unique characteristics. The power factor decreases as the substrate temperature increases. Electrical resistivity and thermoelectric power have different tendency for the substrate temperature. The power factor can be enhanced by controlling electrical resistivity and thermoelectric power independently at the optimum substrate temperature.
  • Keywords
    Ge-Si alloys; amorphous semiconductors; electrical resistivity; gold; semiconductor thin films; thermoelectric power; vacuum deposition; 600 K; SiGe:Au; SiGeAu; a-SiGeAu thin films; electrical resistivity; power factor; substrate temperature effects; temperature dependence; thermoelectric power; thermoelectric properties; Amorphous materials; Electric resistance; Gold; Reactive power; Semiconductor thin films; Sputtering; Temperature control; Temperature dependence; Thermoelectricity; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermoelectrics, 2002. Proceedings ICT '02. Twenty-First International Conference on
  • Print_ISBN
    0-7803-7683-8
  • Type

    conf

  • DOI
    10.1109/ICT.2002.1190356
  • Filename
    1190356