DocumentCode :
3338900
Title :
The study for substrate temperature effects on thermoelectric properties of the amorphous Si-Ge-Au thin films
Author :
Miyata, Akiko ; Sato, Yoshikazu ; Okamoto, Yoichi ; Kawahara, Toshio ; Morimoto, Jun
Author_Institution :
Dept. of Mater. Sci. & Eng., Nat. Defense Acad., Kanagawa, Japan
fYear :
2002
fDate :
25-29 Aug. 2002
Firstpage :
442
Lastpage :
445
Abstract :
The control of thermoelectric properties is attempted by changing the, substrate temperature. Amorphous thin films were prepared by the alternate deposition of Si and Ge doped heavily with Au in ultrahigh vacuum chamber. The temperature dependence of electrical resistivity of the sample deposited at 600 K has unique characteristics. The power factor decreases as the substrate temperature increases. Electrical resistivity and thermoelectric power have different tendency for the substrate temperature. The power factor can be enhanced by controlling electrical resistivity and thermoelectric power independently at the optimum substrate temperature.
Keywords :
Ge-Si alloys; amorphous semiconductors; electrical resistivity; gold; semiconductor thin films; thermoelectric power; vacuum deposition; 600 K; SiGe:Au; SiGeAu; a-SiGeAu thin films; electrical resistivity; power factor; substrate temperature effects; temperature dependence; thermoelectric power; thermoelectric properties; Amorphous materials; Electric resistance; Gold; Reactive power; Semiconductor thin films; Sputtering; Temperature control; Temperature dependence; Thermoelectricity; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermoelectrics, 2002. Proceedings ICT '02. Twenty-First International Conference on
Print_ISBN :
0-7803-7683-8
Type :
conf
DOI :
10.1109/ICT.2002.1190356
Filename :
1190356
Link To Document :
بازگشت