DocumentCode
3338900
Title
The study for substrate temperature effects on thermoelectric properties of the amorphous Si-Ge-Au thin films
Author
Miyata, Akiko ; Sato, Yoshikazu ; Okamoto, Yoichi ; Kawahara, Toshio ; Morimoto, Jun
Author_Institution
Dept. of Mater. Sci. & Eng., Nat. Defense Acad., Kanagawa, Japan
fYear
2002
fDate
25-29 Aug. 2002
Firstpage
442
Lastpage
445
Abstract
The control of thermoelectric properties is attempted by changing the, substrate temperature. Amorphous thin films were prepared by the alternate deposition of Si and Ge doped heavily with Au in ultrahigh vacuum chamber. The temperature dependence of electrical resistivity of the sample deposited at 600 K has unique characteristics. The power factor decreases as the substrate temperature increases. Electrical resistivity and thermoelectric power have different tendency for the substrate temperature. The power factor can be enhanced by controlling electrical resistivity and thermoelectric power independently at the optimum substrate temperature.
Keywords
Ge-Si alloys; amorphous semiconductors; electrical resistivity; gold; semiconductor thin films; thermoelectric power; vacuum deposition; 600 K; SiGe:Au; SiGeAu; a-SiGeAu thin films; electrical resistivity; power factor; substrate temperature effects; temperature dependence; thermoelectric power; thermoelectric properties; Amorphous materials; Electric resistance; Gold; Reactive power; Semiconductor thin films; Sputtering; Temperature control; Temperature dependence; Thermoelectricity; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermoelectrics, 2002. Proceedings ICT '02. Twenty-First International Conference on
Print_ISBN
0-7803-7683-8
Type
conf
DOI
10.1109/ICT.2002.1190356
Filename
1190356
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