DocumentCode
3338925
Title
Characteristics of a silicon on insulator neutron detector
Author
Subramanian, Mythili ; Phlips, Bernard ; Kub, Fritz
Author_Institution
Coll. of Sci., George Mason Univ., Fairfax, VA, USA
fYear
2009
fDate
Oct. 24 2009-Nov. 1 2009
Firstpage
1306
Lastpage
1309
Abstract
We have characterized several Silicon On Insulator (SOI) devices for use as neutron detectors. SOI neutron detectors offer the advantage of a rugged structure with large area while incorporating a thin Si layer coated with a converter material. The performance of these SOI detectors depends on the thickness of the Si layer, the dimensions of the strips, on the converter material and its thickness. This paper describes the design of the SOI wafer, the characteristics of the devices on the SOI wafer and the initial testing of the devices as neutron detectors. SOI wafers of two different Si thicknesses, with varying dimensions for the strip pitch were characterized. The IV and CV properties of the different devices were studied. The devices were then coated with the converter material and used to detect neutrons. We present results from a SOI neutron detector of large surface area that is ¿ blind.
Keywords
neutron detection; semiconductor counters; CV property; IV property; SOI neutron detectors; SOI wafer; Si thicknesses; converter material; gamma blind; insulator neutron detector; rugged structure; silicon on insulator devices; strip pitch; surface area; thin Si layer; Absorption; Detectors; Insulation; Laboratories; Neutrons; Semiconductor materials; Silicon on insulator technology; Solid state circuits; Space technology; Strips; γ blind; Semiconductor; Silicon On Insulator; thermal neutron detection;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location
Orlando, FL
ISSN
1095-7863
Print_ISBN
978-1-4244-3961-4
Electronic_ISBN
1095-7863
Type
conf
DOI
10.1109/NSSMIC.2009.5402360
Filename
5402360
Link To Document