Title :
A formal TTCN-based protocol testing for intelligent network
Author :
Kim, Sangki ; Bae, Hyunjoo ; Jun, Kyungpyo
Author_Institution :
Electron. & Telecommun. Res. Inst., Daejeon, South Korea
fDate :
30 Jun-2 Jul 1998
Abstract :
The intelligent network is evolving from its first generation architecture to an advanced platform in Korea. In parallel with the advancement of the IN itself the protocol test technology for IN components is enhanced based on a formal approach. This paper presents our experience with the formal TTCN-based (TTCN: tree and tabular combined notation) intelligent network application conformance testing. We built an integrated test environment which supports the entire process of conformance testing such as test suite generation, test data preparation, test execution, and test result analysis. The INAP conformance test suite generated by the formal technique is verified on the simulation environment for self-testing
Keywords :
automatic testing; conformance testing; digital simulation; formal verification; intelligent networks; protocols; telecommunication computing; IN components; INAP conformance test suite; Korea; SDL; conformance testing; first generation architecture; formal TTCN-based protocol testing; formal technique; integrated test environment; intelligent network; intelligent network application; self-test; simulation environment; test data preparation; test execution; test result analysis; test suite generation; tree and tabular combined notation; Consumer electronics; Government; Intelligent networks; Personal communication networks; Postal services; Protocols; Read only memory; Research and development; Telephony; Testing;
Conference_Titel :
Computers and Communications, 1998. ISCC '98. Proceedings. Third IEEE Symposium on
Conference_Location :
Athens
Print_ISBN :
0-8186-8538-7
DOI :
10.1109/ISCC.1998.702504
