DocumentCode :
3339047
Title :
Improved grating monochromator set-up for EQE measurements of multi-junction solar cells
Author :
Siefer, Gerald ; Gandy, Tobias ; Schachtner, Michael ; Wekkeli, Alexander ; Bett, Andreas W.
Author_Institution :
Fraunhofer Inst. for Solar Energy Syst., Freiburg, Germany
fYear :
2013
fDate :
16-21 June 2013
Abstract :
Grating monochromator set-ups are widely in use for the measurement of the external quantum efficiency (EQE) of solar cells. This paper describes the grating monochromator setup for EQE measurements of multi-junction and concentrator cells at the calibration laboratory (ISE CalLab) at Fraunhofer ISE. The set-up has been updated with innovative features. This includes an optional LED based bias illumination system which is of particular interest for the measurement of multi-junction cells whose subcells show narrow or overlapping absorption bands. Additionally the set-up has been improved in order to allow for the reliable EQE measurement of concentrator cells with areas below 1 mm2. Moreover, the set-up has been modified to measure the I-V-curve of the solar cell under bias light condition. In the case of multi-junction cells this allows to retrieve information about the shape of the I-V-curves of the individual subcells. Low temperature EQE measurements can be performed by replacing the measurement chuck through a cryostat.
Keywords :
solar cells; Fraunhofer ISE; I-V-curves; ISE CalLab; bias light condition; calibration laboratory; concentrator cells; cryostat; external quantum efficiency; grating monochromator set-up improvement; low temperature EQE measurements; measurement chuck; multijunction solar cells; optional LED based bias illumination system; Current measurement; Gratings; Lighting; Optical fibers; Photovoltaic cells; Temperature measurement; Wavelength measurement; characterization; concentrator cells; external quantum efficiency; multi-junction cells;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
Conference_Location :
Tampa, FL
Type :
conf
DOI :
10.1109/PVSC.2013.6744105
Filename :
6744105
Link To Document :
بازگشت