DocumentCode :
333913
Title :
Microstructural Characterization Of Polycrystalline Thin Film CulnSe2: A Promising Yet Complex Material For Photovoltaic Applications.
Author :
Tuttle, John R. ; Albin, David S. ; Carapella, Jeff ; Noufi, Rommel
Author_Institution :
Solar Energy Research Institute
Volume :
5
fYear :
1990
fDate :
12-17 Aug 1990
Firstpage :
31
Lastpage :
36
Keywords :
Electron optics; Optical diffraction; Optical films; Optical materials; Optical microscopy; Photovoltaic systems; Semiconductor materials; Solar power generation; Transistors; X-ray diffraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Energy Conversion Engineering Conference, 1990. IECEC-90. Proceedings of the 25th Intersociety
Print_ISBN :
0-8169-0490-1
Type :
conf
DOI :
10.1109/IECEC.1990.747922
Filename :
747922
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=333913
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