A wide-range low-jitter fully integrated programmable frequency synthesizer building block in a 2.5 V/0.25 μm CMOS process

Author

Kelkar, Ram ; Austin, John ; Blum, Dave ; Brouillette, Allen ; Frank, Todd ; London, Charles ; Reny, Tim ; Streeter, Rick ; Wyatt, Steve

Author_Institution

Microelectron. Div., IBM Corp., Essex Junction, VT, USA

fYear

1999

fDate

1999

Firstpage

357

Lastpage

361

Abstract

This paper describes the design of a wide-range programmable frequency synthesizer building block for graphics-application ASICs. A unique feature of the design is the use of variable gain charge pumps to adjust loop gain as well as zero location in order to handle the wide range of divider values. The synthesizer input frequency range is 2.8125 MHz to 200 MHz, while the output frequency is programmable (via dividers) in the range 5.46875 MHz to 350 MHz. A fully integrated, differential structure results in low jitter. The use of BIST (Built In Self Test) for facilitating production testing is also discussed

Keywords

CMOS digital integrated circuits; application specific integrated circuits; built-in self test; computer graphic equipment; digital phase locked loops; frequency synthesizers; integrated circuit design; integrated circuit testing; jitter; production testing; programmable circuits; 0.25 mum; 2.5 V; 2.8125 to 350 MHz; BIST; CMOS process; divider values; frequency synthesizer PLL; fully integrated differential structure; graphics-application ASICs; loop gain; production testing; programmable output frequency; synthesizer input frequency range; variable gain charge pumps; wide-range low-jitter fully integrated programmable frequency synthesizer building block; wide-range programmable frequency synthesizer; zero location; Automatic testing; Built-in self-test; CMOS process; Charge pumps; Clocks; Filters; Frequency conversion; Frequency synthesizers; Logic testing; Phase locked loops;

fLanguage

English

Publisher

ieee

Conference_Titel

ASIC/SOC Conference, 1999. Proceedings. Twelfth Annual IEEE International

Conference_Location

Washington, DC

Print_ISBN

0-7803-5632-2

Type

conf

DOI

10.1109/ASIC.1999.806534

Filename

806534