Title :
A modular and scalable architecture for the realization of high-speed programmable rank order filters
Author :
Hatirnaz, I. ; Gürkaynak, F.K. ; Leblebici, Yusuf
Author_Institution :
Dept. of Electr. & Comput. Eng., Worcester Polytech. Inst., MA, USA
Abstract :
We present a new scalable architecture for the realization of fully programmable rank order filters (ROF), based on Capacitive Threshold Logic (CTL) gates. Variants of ROFs, especially median filters, are widely used in digital signal and image/video processing and image enhancement. The CTL-based realization of the majority gates used in the ROF architecture allows the filter rank and the window size to be user-programmable, using a much smaller silicon area, compared to conventional realizations of digital median filters. The proposed filter architecture is completely modular and scalable, and the circuit complexity grows only linearly with maximum window size and with word length. Detailed post-layout simulations of the ROF prototype circuit indicate that the new architecture can accommodate sampling clock rates of up to 50 MHz, corresponding to an effective data processing rate of 800 Mb/s for a filter with window size 63 and word length of 16 bits
Keywords :
CMOS digital integrated circuits; circuit complexity; circuit simulation; high-speed integrated circuits; majority logic; median filters; pipeline processing; programmable filters; threshold logic; 0.8 mum; 16 bit; 800 Mbit/s; bit-serial algorithm; capacitive threshold logic gates; circuit complexity; data processing rate; double-poly CMOS process; filter rank; high-speed programmable rank order filters; majority gates; median filters; modular scalable architecture; post-layout simulations; sampling clock rates; silicon area; window size; word length; Circuit simulation; Clocks; Complexity theory; Digital filters; Image enhancement; Logic gates; Sampling methods; Signal processing; Silicon; Virtual prototyping;
Conference_Titel :
ASIC/SOC Conference, 1999. Proceedings. Twelfth Annual IEEE International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5632-2
DOI :
10.1109/ASIC.1999.806539