Title :
Performance and spectroscopic behaviour of DePFET macropixels
Author :
Lauf, T. ; Aschauer, F. ; Herrmann, S. ; Hilchenbach, M. ; Krumrey, M. ; Lechner, P. ; Lutz, G. ; Majewski, P. ; Porro, M. ; Richter, R.H. ; Scholze, F. ; Strueder, L. ; Treis, J. ; De Vita, J. Treis G
fDate :
Oct. 24 2009-Nov. 1 2009
Abstract :
The combined Detector/Amplifier structure DePFET (Depleted P-channel Field Effect Transistor) features excellent energy resolution, low noise readout at high speed and low power consumption. This is combined with the possibility of random acessibility of pixels and on-demand readout. In addition it possesses all advantages of a sideways depleted device, i.e. 100% fill factor and very good quantum efficiency. Combining the DePFET structure with a silicon drift detector (SDD) like drift ring structure forms a so-called macropixel device which allows for large flexibility in terms of pixel size. All this makes DePFET macropixels a promising new building block for large area silicon radiation detector devices. In this paper, first results of qualifying measurements performed with a macropixel prototype are presented. The detector shows good linearity over the investigated energy range and no significant charge loss within the pixel area.
Keywords :
field effect transistors; nuclear electronics; prototypes; readout electronics; silicon radiation detectors; DePFET macropixel performance; DePFET macropixel spectroscopic behaviour; amplifier structure; depleted P-channel field effect transistor; detector structure; drift ring structure; energy resolution; low noise readout; low power consumption; macropixel device; macropixel prototype; on-demand readout; pixel size; sideways depleted device; silicon drift detector; silicon radiation detector devices; Energy consumption; Energy resolution; FETs; High power amplifiers; Linearity; Low-noise amplifiers; Performance evaluation; Prototypes; Silicon radiation detectors; Spectroscopy; APS; DePFET; macropixel; radiation detector;
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-3961-4
Electronic_ISBN :
1095-7863
DOI :
10.1109/NSSMIC.2009.5402389