DocumentCode :
3339552
Title :
Analyzing the spectral luminescence emission of silicon solar cells and wafers
Author :
Schinke, Carsten ; Hinken, David ; Bothe, Klaus ; Schmidt, J. ; Brendel, Rolf
Author_Institution :
Inst. for Solar Energy Res. Hamelin (ISFH), Emmerthal, Germany
fYear :
2013
fDate :
16-21 June 2013
Abstract :
We present an analytical expression for modelling electroluminescence (EL) as well as photoluminescence (PL) data of samples with any combination of planar and arbitrary rough surfaces. The model also accounts for free carrier absorption in highly doped regions of the sample. It is experimentally confirmed by comparison to measured EL and PL spectra of solar cells and wafers featuring different surface geometries. Significant differences in the absorption coefficient data available from literature, which enters the model as tabulated data, are revealed. Using our model, the absorption data by Daub yields the best agreement to the measured luminescence spectra. Moreover, we present a method to determine the rear surface reflectance of samples from the peak wavelength of luminescence spectra.
Keywords :
absorption coefficients; electroluminescence; elemental semiconductors; photoluminescence; rough surfaces; silicon; solar cells; Daub yields; EL modelling; PL spectra; Si; absorption coefficient data; analytical expression; arbitrary rough surfaces; free carrier absorption; luminescence spectra; photoluminescence data; rear surface reflectance; silicon solar cells; spectral luminescence emission analysis; surface geometry; tabulated data; Absorption; Luminescence; Photonics; Photovoltaic cells; Semiconductor device modeling; Surface waves; Wavelength measurement; Charge carrier distribution; Luminescence; Photon escape probability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
Conference_Location :
Tampa, FL
Type :
conf
DOI :
10.1109/PVSC.2013.6744131
Filename :
6744131
Link To Document :
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