• DocumentCode
    3339661
  • Title

    An on-chip fast readout sparsification for a 256-pixel 3D device

  • Author

    Gabrielli, A. ; Giorgi, F. ; Villa, M. ; Morsani, F.

  • Author_Institution
    INFN, Univ. degli Studi di Bologna, Bologna, Italy
  • fYear
    2009
  • fDate
    Oct. 24 2009-Nov. 1 2009
  • Firstpage
    1158
  • Lastpage
    1160
  • Abstract
    A prototype of a 3D ASIC built up of a fast readout architecture, with sparsification capabilities, which interfaces with a matrix of 256 pixel sensor, was recently submitted. The chosen technology is CMOS Chartered 130 nm as it is compatible with the Tezzaron facility to interconnect fate-to-face two silicon wafers allowing for a vertical integration structure by means of through-silicon-vias. Particularly, the readout logic shares one layer of double-layer design that will be stacked at the end of the fabrication process.
  • Keywords
    application specific integrated circuits; nuclear electronics; position sensitive particle detectors; readout electronics; 3D ASIC; 3D application specific integrated circuits; CMOS Chartered; Tezzaron facility; double-layer design; fabrication process; fast readout architecture; on-chip fast readout sparsification; pixel sensor; readout logic; silicon wafers; vertical integration structure; Application specific integrated circuits; CMOS logic circuits; CMOS technology; Collaboration; Foundries; Logic design; Logic devices; Prototypes; Silicon; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-3961-4
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2009.5402396
  • Filename
    5402396