DocumentCode :
3339771
Title :
Practical chip-centric electro-thermal simulations
Author :
Gillon, Renaud ; Joris, Patricia ; Oprins, Herman ; Vandevelde, Bart ; Srinivasan, Adi ; Chandra, Rajit
Author_Institution :
AMI Semicond. Belgium bvba, Oudenaarde
fYear :
2008
fDate :
24-26 Sept. 2008
Firstpage :
220
Lastpage :
223
Abstract :
Full-chip dynamic electro-thermal simulation is achieved by coupling a circuit simulator and a thermal solver. By letting both simulations run with their specific time-step, a higher computational efficiency is achieved. A scheduler synchronizes temperatures in the circuit simulator and dissipation patterns in the thermal solver on an dasiaas-necessarypsila basis. The 3D geometry for the thermal solver is generated automatically from the layout data-base and cross-referenced to the netlist to allow automatic extraction of power-dissipation from circuit simulations. In order to obtain realistic thermal responses for smart-power chips containing large driver transistors, it is essential to define the boundary conditions appropriately and account for package and PCB transients. To do so, the simulation domain is extended to cover the full package body, and uniform boundary conditions are defined to account for the thermal impedance of the PCB and for convection and radiation. Validation results are shown for the case of an SOIC package. Work is on-going on QFN and other power-packages.
Keywords :
circuit simulation; power integrated circuits; printed circuits; thermal management (packaging); PCB transients; chip-centric electro-thermal simulations; circuit simulator; convection; large driver transistors; power dissipation; smart-power chips; thermal impedance; thermal solver; Boundary conditions; Circuit simulation; Computational efficiency; Computational modeling; Coupling circuits; Geometry; Packaging; Power generation; Processor scheduling; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal Inveatigation of ICs and Systems, 2008. THERMINIC 2008. 14th International Workshop on
Conference_Location :
Rome
Print_ISBN :
978-1-4244-3365-0
Electronic_ISBN :
978-2-35500-008-9
Type :
conf
DOI :
10.1109/THERMINIC.2008.4669912
Filename :
4669912
Link To Document :
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