• DocumentCode
    3339771
  • Title

    Practical chip-centric electro-thermal simulations

  • Author

    Gillon, Renaud ; Joris, Patricia ; Oprins, Herman ; Vandevelde, Bart ; Srinivasan, Adi ; Chandra, Rajit

  • Author_Institution
    AMI Semicond. Belgium bvba, Oudenaarde
  • fYear
    2008
  • fDate
    24-26 Sept. 2008
  • Firstpage
    220
  • Lastpage
    223
  • Abstract
    Full-chip dynamic electro-thermal simulation is achieved by coupling a circuit simulator and a thermal solver. By letting both simulations run with their specific time-step, a higher computational efficiency is achieved. A scheduler synchronizes temperatures in the circuit simulator and dissipation patterns in the thermal solver on an dasiaas-necessarypsila basis. The 3D geometry for the thermal solver is generated automatically from the layout data-base and cross-referenced to the netlist to allow automatic extraction of power-dissipation from circuit simulations. In order to obtain realistic thermal responses for smart-power chips containing large driver transistors, it is essential to define the boundary conditions appropriately and account for package and PCB transients. To do so, the simulation domain is extended to cover the full package body, and uniform boundary conditions are defined to account for the thermal impedance of the PCB and for convection and radiation. Validation results are shown for the case of an SOIC package. Work is on-going on QFN and other power-packages.
  • Keywords
    circuit simulation; power integrated circuits; printed circuits; thermal management (packaging); PCB transients; chip-centric electro-thermal simulations; circuit simulator; convection; large driver transistors; power dissipation; smart-power chips; thermal impedance; thermal solver; Boundary conditions; Circuit simulation; Computational efficiency; Computational modeling; Coupling circuits; Geometry; Packaging; Power generation; Processor scheduling; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal Inveatigation of ICs and Systems, 2008. THERMINIC 2008. 14th International Workshop on
  • Conference_Location
    Rome
  • Print_ISBN
    978-1-4244-3365-0
  • Electronic_ISBN
    978-2-35500-008-9
  • Type

    conf

  • DOI
    10.1109/THERMINIC.2008.4669912
  • Filename
    4669912