DocumentCode
3339863
Title
Systematic validation of pipeline interlock for superscalar microarchitectures
Author
Diep, T.A. ; Shen, J.P.
Author_Institution
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear
1995
fDate
27-30 June 1995
Firstpage
100
Lastpage
109
Abstract
The paper presents a new approach to microarchitecture validation that adopts a paradigm analogous to that of automatic test pattern generation (ATPG) for digital logic testing. In this approach, the microarchitecture is rigorously specified in a set of machine description files. Based on these files, all possible pipeline hazards can be systematically identified Using this hazard list (analogous to a fault list for ATPG), specific sequences of instructions (analogous to test patterns) are automatically generated and constitute the test program. The execution of this test program validates the correct detection and resolution of all interinstruction dependences by the microarchitecture´s pipeline interlock mechanism. Actual software tools have been developed for the automatic construction of the hazard list and the automatic generation of the test sequences. These explicitly generated can achieve higher sequences coverage in fewer cycles than adhoc approaches. 100% coverage of the hazard list can be ensured. These tools have been applied to four contemporary superscalar processors, namely the Alpha AXP 21064 and 21164 microprocessors, and the PowerPC 601 and 620 microprocessors.<>
Keywords
automatic test software; parallel architectures; pipeline processing; Alpha AXP 21064; PowerPC 601; automatic test pattern generation; fault list; interinstruction dependences; machine description files; microarchitecture validation; pipeline hazards; pipeline interlock; pipeline interlock mechanism; superscalar microarchitectures; superscalar processors; systematic validation; Automatic test pattern generation; Automatic testing; Fault diagnosis; Hazards; Logic testing; Microarchitecture; Microprocessors; Pipelines; System testing; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Fault-Tolerant Computing, 1995. FTCS-25. Digest of Papers., Twenty-Fifth International Symposium on
Conference_Location
Pasadena, CA, USA
Print_ISBN
0-8186-7079-7
Type
conf
DOI
10.1109/FTCS.1995.466993
Filename
466993
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