Title :
Fault injection emulation for field programmable analog arrays
Author :
Slaughter, Thomas ; Stroud, Charles
Author_Institution :
Dept. of Electr. & Comput. Eng., North Carolina Univ., Charlotte, NC, USA
Abstract :
We present a practical and economical method for physical fault insertion in analog circuits using field programmable analog arrays (FPAAs) for use in the development and evaluation of manufacturing and system-level tests for analog and mixed-signal integrated circuits and systems. The method involves the manipulation of configuration bits used to program the FPAA to emulate catastrophic faults (shorts and opens) and parametric faults (component values outside of acceptable ranges) in the FPAA during operation of the analog circuitry.
Keywords :
automatic testing; fault diagnosis; integrated circuit testing; mixed analogue-digital integrated circuits; FPAA; catastrophic faults; component values; configuration bits; fault injection emulation; field programmable analog arrays; mixed-signal integrated circuits; parametric faults; physical fault insertion; system-level tests; Circuit faults; Circuit simulation; Circuit testing; Emulation; Field programmable analog arrays; Field programmable gate arrays; Manufacturing; Prototypes; System testing; Virtual prototyping;
Conference_Titel :
Mixed-Signal Design, 2003. Southwest Symposium on
Print_ISBN :
0-7803-7778-8
DOI :
10.1109/SSMSD.2003.1190429
