Title :
Point-source detection using energy and imaging information from 3D-position-sensitive semiconductor detectors
Author :
Wahl, Christopher G. ; He, Zhong
Author_Institution :
Dept. of Nucl. Eng. & Radiol. Sci., Univ. of Michigan, Ann Arbor, MI, USA
fDate :
Oct. 24 2009-Nov. 1 2009
Abstract :
Three-dimensional-position-sensitive semiconductor detectors provide both the energy and the locations of each gamma-ray interaction in the detector. From these data, Compton-imaging methods can reconstruct the source distribution around the detector as a function of energy. Automated detection and identification methods have been developed to use this combined energy and imaging information to detect the presence of point sources of radiation in a background environment with an unknown energy spectrum and a uniform spatial distribution, as well as to identify the nuclide, localize its position, and estimate the source strength. Experimental performance was better than the commercial software Genie 2000 (Canberra) that uses only spectral information. Performance for all methods is shown as a function of false-alarm probability using experimental data collected on a 20 mm à 20 mm à 15 mm CdZnTe detector.
Keywords :
Compton effect; gamma-ray interactions; germanium radiation detectors; position sensitive particle detectors; 3D-Position-Sensitive Semiconductor Detectors; Canberra; Compton-imaging methods; Genie 2000; automated detection; background environment; energy-and-imaging information; false-alarm probability; gamma-ray interaction; identification methods; point-source detection; source distribution; spectral information; uniform spatial distribution; unknown energy spectrum; Gamma ray detection; Gamma ray detectors; Helium; Image reconstruction; Image resolution; Nuclear and plasma sciences; Optical imaging; Radiation detectors; Semiconductor radiation detectors; Software performance;
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-3961-4
Electronic_ISBN :
1095-7863
DOI :
10.1109/NSSMIC.2009.5402429