DocumentCode :
3340455
Title :
Measurements of entrance-surface vs. conventional single-ended readout of a monolithic scintillator
Author :
Hunter, William C J ; Li, Xiaoli ; McDougald, Wendy ; Griesmer, Jerome J. ; Shao, Lingxiong ; Zahn, Robert ; Lewellen, Tom K. ; Miyaoka, Robert S.
Author_Institution :
Dept. of Radiol., Univ. of Washington, Seattle, WA, USA
fYear :
2011
fDate :
23-29 Oct. 2011
Firstpage :
3650
Lastpage :
3653
Abstract :
Availability of compact high-gain, low-noise Silicon Photomultipliers (SiPM) prompts us to examine readout sensors on the entrance surface (SES) as compared to the conventional single-ended readout with sensors on the opposing surface. We measured detector response statistics versus 3D position for these configurations using an 8×8 SiPM array on a 15-mm-thick by 32-mm-wide LYSO block. We calibrate an independently distributed multivariate-normal likelihood model and use it to generate maximum-likelihood estimates of 3D interaction position. Spatial resolution improved 14% and timing resolution improved 10% for the SES device. Bias was unaffected. Photodetection efficiency of our prototype SiPM may have limited further improvement in positioning and timing performance. In future work, we will look to utilize SiPM arrays with enhanced photodetection efficiency.
Keywords :
calibration; maximum likelihood estimation; nuclear electronics; photodetectors; photomultipliers; readout electronics; solid scintillation detectors; 3D interaction position; Silicon Photomultiplier; calibration; conventional single ended readout; detector response statistics; entrance surface readout; independently distributed multivariate normal likelihood model; maximum likelihood estimates; monolithic scintillator; photodetection efficiency; spatial resolution; Biomedical imaging; Image resolution; Performance evaluation; Position measurement; Signal resolution; Three dimensional displays; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
Conference_Location :
Valencia
ISSN :
1082-3654
Print_ISBN :
978-1-4673-0118-3
Type :
conf
DOI :
10.1109/NSSMIC.2011.6153688
Filename :
6153688
Link To Document :
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