Title :
Life condition monitoring on smart power devices using a sequence of current and charge-based capacitance measurements
Author :
Zhenqiu Ning ; De Vylder, E. ; Vlachakis, B. ; Delecourt, H.-X. ; Gillon, Renaud ; Van Torre, Patrick ; Hegsted, D.
Author_Institution :
AMI Semicond. Belgium, Oudenaarde
Abstract :
The precise life condition monitoring on smart power devices is important for smart power circuit design. To perform such a monitoring, a technique based on charge-based capacitance measurement has been developed, by which all DC, AC measurements and stress are implemented in sequence on a device. Measurement, stress and re-measurement are repeated on a logarithmic time sequence, and key parameters for the life condition monitoring are extracted from the measured curves. The degradation of the key parameters is characterized as a measure for the life condition monitoring. The technique is accurate, flexible and with lower cost.
Keywords :
capacitance measurement; condition monitoring; network synthesis; power integrated circuits; AC measurements; DC measurements; charge-based capacitance measurements; life condition monitoring; logarithmic time sequence; smart power circuit design; smart power devices; Capacitance measurement; Condition monitoring; Microelectronics; Testing;
Conference_Titel :
Microelectronic Test Structures, 2008. ICMTS 2008. IEEE International Conference on
Conference_Location :
Edinburgh
Print_ISBN :
978-1-4244-1800-8
Electronic_ISBN :
978-1-4244-1801-5
DOI :
10.1109/ICMTS.2008.4509312