DocumentCode :
3340625
Title :
Sparsity constrained sinogram inpainting for metal artifact reduction in x-ray computed tomography
Author :
Mehranian, A. ; Ay, M.R. ; Rahmim, A. ; Zaidi, H.
Author_Institution :
RCSTIM, Tehran Univ. of Med. Sci., Tehran, Iran
fYear :
2011
fDate :
23-29 Oct. 2011
Firstpage :
3694
Lastpage :
3699
Abstract :
In this paper, we proposed a new projection completion metal artifact reduction (MAR) algorithm in x-ray computed tomography (CT) using a sparsity based sinogram inpainting (interpolation) technique. We developed the MAR algorithm on a Bayesian framework in which a wavelet-based generalized Gaussian (ℓp) prior was applied and then the inpainting problem was formulated as a constrained optimization problem. For the optimization, we derived a projected gradient descent algorithm using a majorization-minimization technique. The gradient step was performed by a soft thresholding operator for an ℓ1 prior, and a hard thresholding with a decaying threshold for an ℓ0 prior. We utilized a tight frame of translation-invariant wavelets implemented by undecimated discrete wavelet transform. As in the clinical setting there is no ground truth CT image to objectively evaluate the performance of a proposed MAR algorithm, we also introduced a novel approach to simulate metal artifacts in a real CT dataset. The results showed that the proposed MAR algorithm using hard thresholding efficiently recovers and inpaints the sinogram projections corrupted by metallic implants.
Keywords :
computerised tomography; Bayesian framework; X-ray computed tomography; majorization-minimization technique; metal artifact reduction; projected gradient descent algorithm; projection completion MAR algorithm; sinogram inpainting technique; sparsity constrained sinogram; translation-invariant wavelets; wavelet-based generalized Gaussian; Biomedical imaging; Computed tomography; Image reconstruction; Image resolution; Streaming media; TV;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
Conference_Location :
Valencia
ISSN :
1082-3654
Print_ISBN :
978-1-4673-0118-3
Type :
conf
DOI :
10.1109/NSSMIC.2011.6153697
Filename :
6153697
Link To Document :
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