Title :
In situ space charge profile measurements on electronic irradiated material by LIMM
Author :
Bouchareb, S. ; Griseri, V. ; Berquez, Laurent
Author_Institution :
LAPLACE, Univ. de Toulouse, Toulouse, France
fDate :
June 30 2013-July 4 2013
Abstract :
Material used in space aircraft are in contact with a large panel of charged particles. Dielectrics can store charges up to a certain extend above which electrostatic discharges might occur. To prevent these phenomena that can be harmful for the embarked electronic devices, the electrical behavior of those materials under irradiation must be studied. In the present case, we are only interested in the effect of electrons on dielectrics materials properties. To do so, an irradiation chamber has been equipped with various characterization tools to perform measurements in-situ. This work is focused on in situ space charge measurements by Pulse Electro Acoustic (PEA) technique and Laser Intensity Modulated Method (LIMM) during and post-irradiation. Experimental space charge distributions obtained by both techniques will be presented and discussed taking into account the measurement arrangements.
Keywords :
acoustoelectric effects; charge measurement; electron beam effects; measurement by laser beam; space charge; LIMM; charged particles; dielectric materials; electronic irradiated material; electrostatic discharges; in situ space charge profile measurements; irradiation chamber; laser intensity modulated method; pulse electro acoustic technique; space aircraft; Dielectric measurement; Dielectrics; Electrodes; Measurement by laser beam; Protocols; Radiation effects; Space charge; LIMM; PEA; Space charge; electronic irradiation;
Conference_Titel :
Solid Dielectrics (ICSD), 2013 IEEE International Conference on
Conference_Location :
Bologna
Print_ISBN :
978-1-4799-0807-3
DOI :
10.1109/ICSD.2013.6619708