DocumentCode :
3340727
Title :
Simulation of complex geometries in GATE
Author :
Nollet, Tom ; De Beenhouwer, Jan ; Van Holen, Roel ; Vandenberghe, Stefaan ; Staelens, Steven
Author_Institution :
Med. Image & Signal Process. group, Ghent Univ. - IBBT, Ghent, Belgium
fYear :
2009
fDate :
Oct. 24 2009-Nov. 1 2009
Firstpage :
4190
Lastpage :
4192
Abstract :
Collimator optimization plays an important role in single photon emission computed tomography (SPECT). Nowadays complex geometries are added frequently in new designs and sometimes these geometries have no simple parametric description. The simulation of such a collimator poses a problem if one wants to use the Monte Carlo simulator GATE. A collimator in GATE can only be built using a limited set of parametric descriptions. A solution to this problem is a triangulated approximation of the structure at hand. Therefore, new functionality based on the tessellated solids in Geant4 was added to GATE. It makes the simulation of geometries with an arbitrary complexity possible if the virtual reality modeling language (VRML) description of the triangulated volume is provided. Our method was validated against standard GATE for a single knife edge pinhole collimator. The simulated difference for both sensitivity and resolution for the pinhole is lower than 0.48 % for the highest accuracy of triangulation. The major drawback of the current implementation is the computational complexity which increases linearly with the number of triangles.
Keywords :
Monte Carlo methods; collimators; computerised tomography; geometry; optimisation; Geant4; Monte Carlo simulator GATE; SPECT; collimator optimization; complex geometries; pinhole collimator; single photon emission computed tomography; tessellated solids; virtual reality modeling language description; Collimators; Computational complexity; Computational geometry; Computational modeling; Design automation; Monte Carlo methods; Nuclear and plasma sciences; Single photon emission computed tomography; Solid modeling; Virtual reality;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location :
Orlando, FL
ISSN :
1095-7863
Print_ISBN :
978-1-4244-3961-4
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2009.5402453
Filename :
5402453
Link To Document :
بازگشت