DocumentCode :
3340938
Title :
Improvement of plasmonic field-matter interaction by subwavelength dielectric gratings
Author :
Nak-Hyeon Kim ; Kyung Min Byun ; Seung Ho Choi ; Kim, Young L.
Author_Institution :
Dept. of Biomed. Eng., Kyung Hee Univ., Yongin, South Korea
fYear :
2013
fDate :
June 30 2013-July 4 2013
Firstpage :
572
Lastpage :
575
Abstract :
We investigate that the detection sensitivity in surface plasmon resonance (SPR) biosensors can be significantly enhanced by employing subwavelength dielectric gratings deposited on a gold film. The enhancement is due to an improvement of field-matter interaction, i.e., enhanced evanescent field intensity at the binding region and increased surface reaction area. After a large-area SiO2 grating fabricated by nanoimprint lithography, the sensor performance measured by parylene film shows that the SPR substrates combined with a dielectric grating provide a notable sensitivity improvement compared to a conventional bare gold film. We also find that plasmon field can be more confined and enhanced at the dielectric gratings with a larger width. The proposed SPR structure could potentially be useful in a variety of plasmonic applications including high-sensitivity biosensors.
Keywords :
biosensors; diffraction gratings; finite difference time-domain analysis; gold; metallic thin films; nanolithography; optical sensors; optical waveguides; plasmonics; silicon compounds; soft lithography; surface chemistry; surface plasmon resonance; Au-SiO2; binding region; deposition; detection sensitivity; evanescent field intensity; gold film; nanoimprint lithography; parylene film; plasmonic field-matter interaction; subwavelength dielectric gratings; surface plasmon resonance biosensors; surface reaction area; Dielectrics; Films; Gold; Gratings; Optimized production technology; Sensitivity; Substrates; field-matter interaction; nanoimprint lithography; subwavelength dielectric grating; surface plasmon resonance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid Dielectrics (ICSD), 2013 IEEE International Conference on
Conference_Location :
Bologna
ISSN :
2159-1687
Print_ISBN :
978-1-4799-0807-3
Type :
conf
DOI :
10.1109/ICSD.2013.6619721
Filename :
6619721
Link To Document :
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