Title :
3D Markov Random Field in realistic inverse scattering
Author :
Autieri, R. ; D´Urso, M. ; Eyraud, C. ; Litman, A. ; Pascazio, V. ; Isernia, T.
Author_Institution :
Dipt. per le Tecnol., Univ. di Napoli Parthenope, Napoli, Italy
Abstract :
This communication deals with the reconstruction of three-dimensional target from experimental multiple-frequency data measured in the anechoic chamber of the Institut Fresnel (Marseille, France). In order to take into account the random noise present in the experiments, a Bayesian approach is considered. In particular, the inversion procedure takes advantage from the joint use of the Contrast Source-Extended Born model and of a Markov Random Field regularization. We also considered a cost functional appropriately weighted by coefficients which change with the frequency, the incident angle and the receiving angle. In fact, each scattered field measurement is balanced with the noise disturbing the data.
Keywords :
Bayes methods; Markov processes; anechoic chambers (electromagnetic); electric field measurement; electromagnetic wave scattering; inverse problems; random noise; solid modelling; Bayesian approach; Markov random field regularization; anechoic chamber; contrast source-extended born model; incident angle; inverse scattering; multiple-frequency data; random noise; receiving angle; scattered field measurement; three-dimensional target reconstruction; Estimation; Image reconstruction; Inverse problems; Markov random fields; Noise; Permittivity; Scattering; Contrast Source-Extended Born; Fresnel Data; Linear inversion; Markov Random Field based regularization;
Conference_Titel :
Geoscience and Remote Sensing Symposium (IGARSS), 2010 IEEE International
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-9565-8
Electronic_ISBN :
2153-6996
DOI :
10.1109/IGARSS.2010.5651908