DocumentCode
3341124
Title
[Opinion]
fYear
2008
fDate
16-20 March 2008
Abstract
Presents the introductory welcome message from the conference proceedings. May include the conference officers´ congratulations to all involved with the conference event and publication of the proceedings record.
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium, 2008. Semi-Therm 2008. Twenty-fourth Annual IEEE
Conference_Location
San Jose, CA
ISSN
1065-2221
Print_ISBN
978-1-4244-2123-7
Type
conf
DOI
10.1109/STHERM.2008.4509351
Filename
4509351
Link To Document