DocumentCode
3341193
Title
Table of contents
fYear
2008
fDate
16-20 March 2008
Abstract
Presents the table of contents of the proceedings.
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium, 2008. Semi-Therm 2008. Twenty-fourth Annual IEEE
Conference_Location
San Jose, CA
ISSN
1065-2221
Print_ISBN
978-1-4244-2123-7
Type
conf
DOI
10.1109/STHERM.2008.4509356
Filename
4509356
Link To Document