• DocumentCode
    3341267
  • Title

    Depths of chemical impurity states in Polyethylene; The big picture from first principles

  • Author

    Huzayyin, Ahmed ; Boggs, Steven ; Ramprasad, Ramamurthy

  • Author_Institution
    ECE Dept., Univ. of Toronto, Toronto, ON, Canada
  • fYear
    2013
  • fDate
    June 30 2013-July 4 2013
  • Firstpage
    15
  • Lastpage
    18
  • Abstract
    Computational quantum mechanics, within the frame work of density functional theory (DFT) was used to determine the depths of impurity states created by common chemical impurities in polyethylene. Depths of traps/hopping sites were between 0.1 eV and 2.4 eV and were classified into shallow traps/hopping sites, deep traps, and deeper traps. Such depths suggest that chemical impurities can play major roles in trapping and hopping processes, can explain the observed activation energy of conduction, and shape the barriers to charge injection. Thus, chemical impurities could dominate high field conduction in polyethylene. The type of impurity bonds and their lengths are correlated with the depth of impurities they create. Such correlation is linear. A procedure to determine depth of states created by an impurity, without using DFT is presented.
  • Keywords
    polyethylene insulation; polymer insulators; quantum theory; DFT; chemical impurity states depths; computational quantum mechanics; density functional theory; hopping site; impurity bonds; polyethylene; traps site; Chemicals; Discrete Fourier transforms; Electron traps; Impurities; Photonic band gap; Plastics; Polyethylene; density functional theory; high field conduction; impurity states; polyethylene; trap depths;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid Dielectrics (ICSD), 2013 IEEE International Conference on
  • Conference_Location
    Bologna
  • ISSN
    2159-1687
  • Print_ISBN
    978-1-4799-0807-3
  • Type

    conf

  • DOI
    10.1109/ICSD.2013.6619738
  • Filename
    6619738