DocumentCode
3341267
Title
Depths of chemical impurity states in Polyethylene; The big picture from first principles
Author
Huzayyin, Ahmed ; Boggs, Steven ; Ramprasad, Ramamurthy
Author_Institution
ECE Dept., Univ. of Toronto, Toronto, ON, Canada
fYear
2013
fDate
June 30 2013-July 4 2013
Firstpage
15
Lastpage
18
Abstract
Computational quantum mechanics, within the frame work of density functional theory (DFT) was used to determine the depths of impurity states created by common chemical impurities in polyethylene. Depths of traps/hopping sites were between 0.1 eV and 2.4 eV and were classified into shallow traps/hopping sites, deep traps, and deeper traps. Such depths suggest that chemical impurities can play major roles in trapping and hopping processes, can explain the observed activation energy of conduction, and shape the barriers to charge injection. Thus, chemical impurities could dominate high field conduction in polyethylene. The type of impurity bonds and their lengths are correlated with the depth of impurities they create. Such correlation is linear. A procedure to determine depth of states created by an impurity, without using DFT is presented.
Keywords
polyethylene insulation; polymer insulators; quantum theory; DFT; chemical impurity states depths; computational quantum mechanics; density functional theory; hopping site; impurity bonds; polyethylene; traps site; Chemicals; Discrete Fourier transforms; Electron traps; Impurities; Photonic band gap; Plastics; Polyethylene; density functional theory; high field conduction; impurity states; polyethylene; trap depths;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid Dielectrics (ICSD), 2013 IEEE International Conference on
Conference_Location
Bologna
ISSN
2159-1687
Print_ISBN
978-1-4799-0807-3
Type
conf
DOI
10.1109/ICSD.2013.6619738
Filename
6619738
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