DocumentCode
3341341
Title
Rapid thermal processing: a comprehensive classification of silicon materials
Author
Peters, S. ; Lee, J.Y. ; Ballif, C. ; Borchert, D. ; Glunz, S.W. ; Warta, Wilhelm ; Willeke, G.
Author_Institution
Lab. & Servicecenter, Fraunhofer ISE, Gelsenkirchen, Germany
fYear
2002
fDate
19-24 May 2002
Firstpage
214
Lastpage
217
Abstract
Depending on the specific impurities and defect spectrum of a silicon material, the minority carrier lifetime can react diversely to rapid thermal processing (RTP). We have measured the lifetime of silicon materials before and after RTP and have diffused solar cells either by RTP or by conventional quartz tube furnace processing (CFP). Our investigations show that the lifetime of Fz-Si can be preserved during RTP resulting in up to 18.7 % efficient solar cells. For 1.4 Ωcm PV-grade Cz-Si, the stable lifetime after light degradation could be improved by up to 60 % by RTP. In the case of EFG-Si, the same average cell efficiency was obtained with RTP diffusion as with the industrial reference diffusion process. However, in the case of block-cast mc-Si, the lifetime decreases with increasing diffusion temperature indicating that P-diffusion in the second range might provide insufficient gettering.
Keywords
carrier lifetime; diffusion; elemental semiconductors; minority carriers; phosphorus; rapid thermal processing; semiconductor device measurement; silicon; solar cells; 1.4 ohmcm; 18.7 percent; Cz-Si; EFG-Si; P-diffusion; RTP; Si:P; efficiency; gettering; lifetime; minority carrier lifetime; rapid thermal processing; silicon material; solar cells; Charge carrier lifetime; Degradation; Diffusion processes; Furnaces; Gettering; Impurities; Photovoltaic cells; Rapid thermal processing; Silicon; Temperature distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
ISSN
1060-8371
Print_ISBN
0-7803-7471-1
Type
conf
DOI
10.1109/PVSC.2002.1190494
Filename
1190494
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