• DocumentCode
    3341341
  • Title

    Rapid thermal processing: a comprehensive classification of silicon materials

  • Author

    Peters, S. ; Lee, J.Y. ; Ballif, C. ; Borchert, D. ; Glunz, S.W. ; Warta, Wilhelm ; Willeke, G.

  • Author_Institution
    Lab. & Servicecenter, Fraunhofer ISE, Gelsenkirchen, Germany
  • fYear
    2002
  • fDate
    19-24 May 2002
  • Firstpage
    214
  • Lastpage
    217
  • Abstract
    Depending on the specific impurities and defect spectrum of a silicon material, the minority carrier lifetime can react diversely to rapid thermal processing (RTP). We have measured the lifetime of silicon materials before and after RTP and have diffused solar cells either by RTP or by conventional quartz tube furnace processing (CFP). Our investigations show that the lifetime of Fz-Si can be preserved during RTP resulting in up to 18.7 % efficient solar cells. For 1.4 Ωcm PV-grade Cz-Si, the stable lifetime after light degradation could be improved by up to 60 % by RTP. In the case of EFG-Si, the same average cell efficiency was obtained with RTP diffusion as with the industrial reference diffusion process. However, in the case of block-cast mc-Si, the lifetime decreases with increasing diffusion temperature indicating that P-diffusion in the second range might provide insufficient gettering.
  • Keywords
    carrier lifetime; diffusion; elemental semiconductors; minority carriers; phosphorus; rapid thermal processing; semiconductor device measurement; silicon; solar cells; 1.4 ohmcm; 18.7 percent; Cz-Si; EFG-Si; P-diffusion; RTP; Si:P; efficiency; gettering; lifetime; minority carrier lifetime; rapid thermal processing; silicon material; solar cells; Charge carrier lifetime; Degradation; Diffusion processes; Furnaces; Gettering; Impurities; Photovoltaic cells; Rapid thermal processing; Silicon; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
  • ISSN
    1060-8371
  • Print_ISBN
    0-7803-7471-1
  • Type

    conf

  • DOI
    10.1109/PVSC.2002.1190494
  • Filename
    1190494