Title :
Estimating key parameters in the EKV MOST model for analogue design and simulation
Author :
Machado, Gerson A S ; Enz, Christian C. ; Bucher, Matthias
Author_Institution :
Dept. of Electr. Eng., Imperial Coll. of Sci., Technol. & Med., London, UK
fDate :
30 Apr-3 May 1995
Abstract :
Recent availability of the public-domain EKV (Enz-Krummenacher-Vittoz) MOST model from EPFL in a number of circuit simulators facilitates the intuitive design, analysis and simulation of analogue and mixed-mode circuits and systems exploring the numerous modes of operation of the MOST, particularly at low-voltage (LV) and low-current (LC). A practical approach for either extracting the most critical parameters and/or adapting those already available from widely used SPICE models (levels 2 and 3) for use with the EKV model is presented and opportunities for engineering education are considered. The effectiveness of the approach is illustrated by measured results from CMOS and BiCMOS technologies
Keywords :
BiCMOS integrated circuits; CMOS integrated circuits; MOSFET; circuit CAD; circuit analysis computing; integrated circuit design; mixed analogue-digital integrated circuits; semiconductor device models; BiCMOS technology; CMOS technology; EKV MOST model; EPFL; analogue design; circuit simulators; engineering education; mixed-mode circuits; most critical parameters; operation modes; Analytical models; Availability; BiCMOS integrated circuits; CMOS technology; Circuit simulation; Circuits and systems; Engineering education; Parameter estimation; SPICE; Semiconductor device modeling;
Conference_Titel :
Circuits and Systems, 1995. ISCAS '95., 1995 IEEE International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-2570-2
DOI :
10.1109/ISCAS.1995.523711
