Author_Institution :
State Key Lab. of Electr. Insulation & Power Equip., Xi´an Jiaotong Univ., Xi´an, China
Abstract :
In this paper, a pulsed scanning method for the total electron emission yield measurement of insulating materials is proposed. A total electron detector with big hollow space and insulating spacer, and a pulsed yield scanning measurement system is recommended. This method can avoid influence from the charged surface of the insulating material. Using the system, the total secondary electron emission yields of several typical polymers, such as, PA, PS, PI, PTFE, HDPE, PC, PMMA, PEEK, PET, UHMW-PE, have been reported, as induced by a 30 microsecond pulse of primary electrons with ~ 20 nA incident beam current and energies up to 2500 eV.
Keywords :
electron emission; organic insulating materials; polymers; HDPE; PA; PC; PEEK; PET; PI; PMMA; PS; PTFE; UHMW-PE; charged surface; hollow space; incident beam current; insulating materials; insulating spacer; primary electrons; pulsed yield scanning measurement system; total electron detector; total electron emission yield measurement; total secondary electron emission yield; typical polymers; Current measurement; Detectors; Electron emission; Plastics; Pulse measurements; Solids; polymers; total electron emission yield;
