Total electron emission yields of typical polymers

Author

Yu Chen ; Jiang Wu ; Mengu Cho ; Toyoda, Kentaroh

Author_Institution

State Key Lab. of Electr. Insulation & Power Equip., Xi´an Jiaotong Univ., Xi´an, China

fYear

2013

fDate

June 30 2013-July 4 2013

Firstpage

752

Lastpage

755

Abstract

In this paper, a pulsed scanning method for the total electron emission yield measurement of insulating materials is proposed. A total electron detector with big hollow space and insulating spacer, and a pulsed yield scanning measurement system is recommended. This method can avoid influence from the charged surface of the insulating material. Using the system, the total secondary electron emission yields of several typical polymers, such as, PA, PS, PI, PTFE, HDPE, PC, PMMA, PEEK, PET, UHMW-PE, have been reported, as induced by a 30 microsecond pulse of primary electrons with ~ 20 nA incident beam current and energies up to 2500 eV.

Keywords

electron emission; organic insulating materials; polymers; HDPE; PA; PC; PEEK; PET; PI; PMMA; PS; PTFE; UHMW-PE; charged surface; hollow space; incident beam current; insulating materials; insulating spacer; primary electrons; pulsed yield scanning measurement system; total electron detector; total electron emission yield measurement; total secondary electron emission yield; typical polymers; Current measurement; Detectors; Electron emission; Plastics; Pulse measurements; Solids; polymers; total electron emission yield;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid Dielectrics (ICSD), 2013 IEEE International Conference on

Conference_Location

Bologna

ISSN

2159-1687

Print_ISBN

978-1-4799-0807-3

Type

conf

DOI

10.1109/ICSD.2013.6619757

Filename

6619757