Title :
Segmentation of X-ray micro-computed tomography using Neural Networks trained with Statistical Information: Application to biomedical images
Author :
Alvarenga de Moura Meneses, Anderson ; De Almeida, André Pereira ; Soares, José ; Azambuja, Patrícia ; Gonzalez, Marcelo Salabert ; Cardoso, Simone ; Braz, Delson ; De Almeida, Carlos Eduardo ; Barroso, Regina Cely
Author_Institution :
Fed. Univ. of Western Para & the Rio de Janeiro State Univ., Sao Francisco, Brazil
Abstract :
In the present work we describe ongoing research on the application of Artificial Neural Networks (ANNs) trained with Statistical Information in order to segment a slice of a Rhodnius Prolixus insect (vector of the Chagas´s disease) μCT scan. The images were acquired at the Synchrotron Radiation for MEdical Physics (SYRMEP) beam line at the Elettra Laboratory (Trieste, Italy). Two specialized ANNs were trained with statistical information for the segmentation task. The first ANN segmented the image of interest in two regions (one of them with white pixels and the other with non-white pixels), considering the enhancement of intensity due to phase contrast effect and despite the complexity of the image. The second ANN was able to recognize, amongst the white pixels, the ones related to the insect region. Preliminary results demonstrate the viability of the method in the segmentation of X-ray μCT.
Keywords :
X-ray microscopy; computerised tomography; image enhancement; image segmentation; learning (artificial intelligence); medical image processing; neural nets; Chagas disease; Rhodnius Prolixus insect; SYRMEP beam line; Synchrotron Radiation for MEdical Physics; X-ray microcomputed tomography segmentation; artificial neural networks; biomedical image; image complexity; intensity enhancement; microCT scan; neural network training; nonwhite pixel; phase contrast effect; statistical information; Artificial neural networks; Biomedical imaging; Image segmentation; Physics;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
Conference_Location :
Valencia
Print_ISBN :
978-1-4673-0118-3
DOI :
10.1109/NSSMIC.2011.6153760