Title :
Separation of bulk diffusion length and rear surface recombination velocity in SR-LBIC mappings
Author :
Isenberg, J. ; Bartels, O. ; Warta, W.
Author_Institution :
Fraunhofer ISE, Freiburg, Germany
Abstract :
SR-LBIC measurements are an important tool for mapping effective diffusion lengths of processed solar cells. This paper investigates the extraction of bulk diffusion length and back surface recombination velocities from SR-LBIC data. Two models for fitting data are studied, one of which takes account for a physical model proposed by Basore (1993), the other one, Spiegel et al. (2000), is a simplification thereof. Simulations with varying noise levels show, that noise is a more severe problem for Lbulk and Sback mappings as compared to Leff mappings, though it should be possible to generate Lbulk and Sback mappings, if the noise level is below approximately 3%. First results of SR-LBIC data analysed with this tool are presented showing the necessity of having at least one measurement at a wavelength that corresponds to a penetration depth around half of the cell thickness.
Keywords :
OBIC; carrier lifetime; semiconductor device noise; solar cells; SR-LBIC mappings; bulk diffusion length; effective diffusion length; noise; penetration depth; rear surface recombination velocity; solar cells; Absorption; Data analysis; Data mining; Length measurement; Noise level; Noise measurement; Photovoltaic cells; Solar power generation; Testing; Wavelength measurement;
Conference_Titel :
Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
Print_ISBN :
0-7803-7471-1
DOI :
10.1109/PVSC.2002.1190525