DocumentCode :
3342045
Title :
Using broad-band irradiance data to model the short circuit response of aSi modules
Author :
Beyer, Hans Georg ; Saetre, Tor Oskar ; Yordanov, Georgi Hristov
Author_Institution :
Dept. of Eng., Univ. of Agder, Grimstad, Norway
fYear :
2013
fDate :
16-21 June 2013
Abstract :
aSi modules show large variations in their response to the incoming irradiance as measured by broad-band irradiance sensors, making the check and prediction of their performance difficult when only broad-band data are available. One approach to overcome this difficulty is given by the use of detailed models to estimate the irradiance spectra from the broad-band data. Here, it is tested to what degree the detailed modeling could be substituted by a semi-empirical approach to reflect the modules response based on but the information on direct and diffuse irradiance and solar geometry. The model performance is measured by its capability to give the correct monthly mean short-circuit current together with a reasonable R2 value of the scatter of modeled and measured data. A first test of a respective model has shown reasonable results.
Keywords :
amorphous semiconductors; optical sensors; short-circuit currents; silicon; solar cells; PV modules; Si; aSi modules; amorphous silicon; broad-band irradiance sensors; irradiance spectra; semiempirical approach; short-circuit current; solar geometry; Atmospheric modeling; Broadband communication; Current measurement; Data models; Educational institutions; Integrated circuit modeling; Short-circuit currents; amorphous silicon; short-circuit current;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
Conference_Location :
Tampa, FL
Type :
conf
DOI :
10.1109/PVSC.2013.6744258
Filename :
6744258
Link To Document :
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