Title :
Classification of aging level of solid dielectric using Fourier transform infrared spectroscopy — Method of discriminant analysis
Author :
Prosr, P. ; Polansky, Radek ; Pihera, Josef
Author_Institution :
Fac. of Electr. Eng., Univ. of West Bohemia in Pilsen, Pilsen, Czech Republic
fDate :
June 30 2013-July 4 2013
Abstract :
The main objective of this paper is to investigate the possibility of application of Fourier transform infrared spectroscopy and method of discriminant analysis for classification of a solid dielectric. Classification method was determined by applying accelerated thermal aging on glass-mica-based insulating system material. Based on previous experience and on the thermal class of the insulating system, the aging temperature was set to 170 °C. Infrared spectra were measured after 192, 384, and 600 hours of aging using technique of Attenuated Total Reflectance in the middle area of the infrared electromagnetic spectrum (4000-600 cm-1). Regarding the results, it is possible to state that the method of discriminant analysis in connection with Fourier transform infrared spectroscopy can be regarded as a proper diagnostic indicator of aging for material of insulating systems.
Keywords :
Fourier transform spectroscopy; ageing; infrared spectroscopy; insulating materials; Fourier transform infrared spectroscopy; accelerated thermal aging; attenuated total reflectance; discriminant analysis method; glass-mica-based insulating system material; infrared electromagnetic spectrum; solid dielectric aging level classification; temperature 170 degC; time 192 hour; time 384 hour; time 600 hour; Aging; Dielectrics; Infrared spectra; Solids; Spectroscopy; Standards; discriminant analysis; infrared spectroscopy; insulating material; temperature aging;
Conference_Titel :
Solid Dielectrics (ICSD), 2013 IEEE International Conference on
Conference_Location :
Bologna
Print_ISBN :
978-1-4799-0807-3
DOI :
10.1109/ICSD.2013.6619789