• DocumentCode
    3342348
  • Title

    Ultrafast response and high sensitivity semiconductor thermocouple

  • Author

    Dashevsky, Z. ; Rabinovich, D. ; Fish, G. ; Kokolova, S. ; Lewis, A.

  • Author_Institution
    Dept. of Mater. Eng., Ben-Gurion Univ. of the Negev, Beer-Sheva, Israel
  • fYear
    1996
  • fDate
    26-29 March 1996
  • Firstpage
    321
  • Lastpage
    325
  • Abstract
    The thermocouple consists of an internal wire (Pt, Au, Ag) inside a glass tube that is pulled down to a diameter of 1-2 /spl mu/m or less. Probes are available with second electrode (leg) from film semiconductor evaporated on the outside of the glass tube. Semiconductor PbTe doping special impurity, provides constant high multitude of the thermoelectric power in the wide temperature interval (-100-200/spl deg/C). Sensitivity of the thermocouple is from 2000 to 300 /spl mu/V/K and does not change for a long time. Special protection on the base of the ultrathin polymer layer permits use of the thermocouple in an aggressive atmosphere. Calculations indicate the response time of the thermocouple is 1 /spl mu/sec. The suitability of this thermocouple for light intensity measurements with micrometer spatial resolution is demonstrated by measuring the focused beam of the laser. In addition, such thermocouples are intrinsically suitable for applications in scanned probe microscopies. All these unique advantages make the pipette thermocouples a new and extremely promising sensor in a variety of applications including microelectronics, microbiology and others.
  • Keywords
    impurities; microscopy; scanning probe microscopy; semiconductor doping; semiconductor thin films; sensitivity; thermocouples; -100 to 200 C; 1 mus; 1 to 2 mum; Ag; Au; PbTe; Pt; aggressive atmosphere; evaporated film semiconductor; glass tube; high sensitivity semiconductor thermocouple; impurity; internal wire; light intensity measurements; microbiology; microelectronics; micrometer spatial resolution; pipette thermocouples; response time; scanned probe microscopies; second electrode; semiconductor PbTe doping; thermocouple sensitivity; thermoelectric power; ultrafast response; ultrathin polymer layer; Atmospheric measurements; Electrodes; Glass; Gold; Leg; Probes; Semiconductor device doping; Semiconductor films; Semiconductor impurities; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermoelectrics, 1996., Fifteenth International Conference on
  • Conference_Location
    Pasadena, CA, USA
  • Print_ISBN
    0-7803-3221-0
  • Type

    conf

  • DOI
    10.1109/ICT.1996.553500
  • Filename
    553500