• DocumentCode
    3342358
  • Title

    Conductive adhesives for low-stress interconnection of thin back-contact solar cells

  • Author

    Eikelboom, D.W.K. ; Bultman, J.H. ; Schönecker, A. ; Meuwissen, M.H.H. ; van den Nieuwenhof, M.A.J.C. ; Meier, D.L.

  • Author_Institution
    ECN Solar Energy, Petten, Netherlands
  • fYear
    2002
  • fDate
    19-24 May 2002
  • Firstpage
    403
  • Lastpage
    406
  • Abstract
    Thin crystalline silicon solar cells cannot be interconnected with standard soldering techniques because of warping and breakage. Interconnection with conductive adhesives showed excellent behavior warping can be avoided and 80μm thin cells do not break during and after interconnection. Contact resistances measured on glued interconnections are similar to soldered contacts. Damp/heat tests show no degradation after 2500 hours at 85°C/85% humidity. Temperature cycling -40/+80°C has shown no effects after 200 cycles. I-V measurements of interconnected thin back-contact cells in mini modules show no loss in fill factor. Test mini modules made with soldered back contacts and glued front contacts show excellent performance even after over 900 cycles. Interconnection with conductive adhesives is a promising technique combining excellent mechanical properties, good conductivity, durability, and low process temperatures thus reducing stress.
  • Keywords
    adhesives; contact resistance; elemental semiconductors; interconnections; internal stresses; semiconductor device measurement; silicon; solar cells; 2500 hour; 80 micron; 85 degC; I-V measurements; Si; conductive adhesives; contact resistance; damp/heat tests; fill factor; low-stress interconnection; silicon solar cells; temperature cycling; thin back-contact solar cells; Conductive adhesives; Crystallization; Degradation; Electrical resistance measurement; Humidity; Photovoltaic cells; Silicon; Soldering; Temperature; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
  • ISSN
    1060-8371
  • Print_ISBN
    0-7803-7471-1
  • Type

    conf

  • DOI
    10.1109/PVSC.2002.1190544
  • Filename
    1190544