• DocumentCode
    3342371
  • Title

    Global exponential stability of fuzzy logical BAM neural networks with Markovian jumping parameters

  • Author

    Zhengfeng Zhang ; Wuneng Zhou ; Dongyi Yang

  • Author_Institution
    Coll. of Inf. Sci. & Technol., Donghua Univ., Shanghai, China
  • Volume
    1
  • fYear
    2011
  • fDate
    26-28 July 2011
  • Firstpage
    411
  • Lastpage
    415
  • Abstract
    In this paper, the global exponential stability of fuzzy logical bidirectional associative memory (BAM) neural networks with Markovian jumping parameters is investigated. The jumping parameters considered here are generated from a continuous-time discrete-state homogeneous Markov process and governed by a Markov process with discrete and finite-state space. The purpose of the problem addressed is to derive some new sufficient conditions to ensure the global exponential stability of the fuzzy logical BAM neural networks with Markovian jumping parameters. By employing a new Lyapunov-Krasovshkii functional, a linear matrix inequality (LMI) approach is developed to establish the desired sufficient conditions. Finally a numerical example is provided to demonstrate the effectiveness of the proposed results.
  • Keywords
    Lyapunov methods; Markov processes; asymptotic stability; fuzzy logic; fuzzy neural nets; linear matrix inequalities; recurrent neural nets; LMI; Lyapunov-Krasovshkii functional; Markovian jumping parameter; bidirectional associative memory; continuous-time discrete-state homogeneous Markov process; discrete-state space; finite-state space; fuzzy logical BAM neural network; global exponential stability; linear matrix inequality; Artificial neural networks; Asymptotic stability; Biological neural networks; Delay; Linear matrix inequalities; Stability analysis; Linear matrix inequality; Lyapunov-Krasovskii functional; Markovian jumping parameters; fuzzy logical BAM neural networks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Natural Computation (ICNC), 2011 Seventh International Conference on
  • Conference_Location
    Shanghai
  • ISSN
    2157-9555
  • Print_ISBN
    978-1-4244-9950-2
  • Type

    conf

  • DOI
    10.1109/ICNC.2011.6022081
  • Filename
    6022081