• DocumentCode
    3342388
  • Title

    Comparison of two charge packet models under dc electric fields

  • Author

    Chen, Gang ; Yutian Wang

  • Author_Institution
    Tony Davies High Voltage Lab., Univ. of Southampton, Southampton, UK
  • fYear
    2013
  • fDate
    June 30 2013-July 4 2013
  • Firstpage
    931
  • Lastpage
    934
  • Abstract
    Charge packet under high electric dc fields has been observed in polyethylene and its formation has been closely associated with ageing and breakdown of the insulating material. To understand the mechanisms several models have been proposed. In this paper, two models originated from completely different approaches have been reviewed. The first model proposed is based on bipolar charge injection together with electric field dependent mobility. It has been found that the negative differential mobility with the electric field is essential for the formation of charge packet. On the other hand, the second model considers the change in conductivity after charge injection. By assigning different conductivities to two different zones it is possible to form a charge packet that bears some similarity with the observed features. Simulations based on these two models have been carried out and both dynamics of charge packet and resultant current in the two models are compared and discussed.
  • Keywords
    ageing; electric breakdown; polyethylene insulation; space charge; DC electric field; ageing; bipolar charge injection; breakdown; charge packet dynamics; charge packet formation; charge packet model; electric field-dependent mobility; insulating material; negative differential mobility; polyethylene; second model; Charge carrier processes; Conductivity; Electric fields; Equations; Materials; Mathematical model; Numerical models; Space charge; charge packet; numerical modeling; polymeric materials;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid Dielectrics (ICSD), 2013 IEEE International Conference on
  • Conference_Location
    Bologna
  • ISSN
    2159-1687
  • Print_ISBN
    978-1-4799-0807-3
  • Type

    conf

  • DOI
    10.1109/ICSD.2013.6619793
  • Filename
    6619793