• DocumentCode
    3342428
  • Title

    Fault simulation and testing of an OTA biquadratic filter

  • Author

    Bishop, A.J. ; Ivanov, A.

  • Author_Institution
    Dept. of Electr. Eng., British Columbia Univ., Vancouver, BC, Canada
  • Volume
    3
  • fYear
    1995
  • fDate
    30 Apr-3 May 1995
  • Firstpage
    1764
  • Abstract
    We examine the testing and fault simulation of an analog operational transconductance amplifier (OTA) biquadratic filter. Catastrophic as well as parametric deviation faults are considered. We determine if the simulated faults are detectable by comparing the output voltage from the fault-free case with each of the faulty cases. We also compare the fault coverage obtained with this voltage verification test versus the faults detectable with supply current monitoring tests. A simple bound is found for the detection of catastrophic faults in the presence of parametric variations. This bound is based on selecting the minimum comparator threshold for comparing the CUT output with the reference signal. As this threshold approaches the peak output deviation due solely to parametric variations, no additional catastrophic faults can be detected using the voltage checking and supply current tests
  • Keywords
    biquadratic filters; circuit analysis computing; circuit testing; comparators (circuits); operational amplifiers; OTA biquadratic filter; fault coverage; fault simulation; fault-free case; minimum comparator threshold; operational transconductance amplifier; output voltage; parametric deviation faults; parametric variations; peak output deviation; reference signal; supply current monitoring tests; voltage checking; voltage verification test; Analog circuits; Automatic testing; Circuit faults; Circuit testing; Current supplies; Electrical fault detection; Fault detection; Filters; Performance evaluation; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1995. ISCAS '95., 1995 IEEE International Symposium on
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    0-7803-2570-2
  • Type

    conf

  • DOI
    10.1109/ISCAS.1995.523755
  • Filename
    523755