DocumentCode :
3342674
Title :
Analysis of fill factor losses using current-voltage curves obtained under dark and illuminated conditions
Author :
Hacke, P. ; Meier, D.L.
Author_Institution :
EBARA Solar Inc., Vernon, PA, USA
fYear :
2002
fDate :
19-24 May 2002
Firstpage :
462
Lastpage :
464
Abstract :
Series resistance was determined using illuminated and dark J-V curves for a group of twenty-eight cells. The change in fill factor due to the series resistance power loss was calculated and subtracted from the Suns-Voc-determined fill factor, which represents the fill factor void of series resistance losses. On average, this difference was found to equal the cell fill factor. This agreement indicates the reliability of each of the components involved in the determination. As a result, the fill factor losses due to series resistance using only dark and illuminated J-V measurements are determined with good accuracy. The limitations of this analysis are also discussed.
Keywords :
current density; electric resistance; solar cells; Suns-Voc determined fill factor; accuracy; current-voltage curves; dark J-V curves; dark conditions; fill factor losses; illuminated J-V curves; illuminated conditions; photovoltaic cells; reliability; series resistance power loss; Airports; Circuit testing; Current density; Electrical resistance measurement; Fabrication; Light sources; Lighting; Loss measurement; Photovoltaic cells; Textile industry;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
ISSN :
1060-8371
Print_ISBN :
0-7803-7471-1
Type :
conf
DOI :
10.1109/PVSC.2002.1190559
Filename :
1190559
Link To Document :
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