• DocumentCode
    3342674
  • Title

    Analysis of fill factor losses using current-voltage curves obtained under dark and illuminated conditions

  • Author

    Hacke, P. ; Meier, D.L.

  • Author_Institution
    EBARA Solar Inc., Vernon, PA, USA
  • fYear
    2002
  • fDate
    19-24 May 2002
  • Firstpage
    462
  • Lastpage
    464
  • Abstract
    Series resistance was determined using illuminated and dark J-V curves for a group of twenty-eight cells. The change in fill factor due to the series resistance power loss was calculated and subtracted from the Suns-Voc-determined fill factor, which represents the fill factor void of series resistance losses. On average, this difference was found to equal the cell fill factor. This agreement indicates the reliability of each of the components involved in the determination. As a result, the fill factor losses due to series resistance using only dark and illuminated J-V measurements are determined with good accuracy. The limitations of this analysis are also discussed.
  • Keywords
    current density; electric resistance; solar cells; Suns-Voc determined fill factor; accuracy; current-voltage curves; dark J-V curves; dark conditions; fill factor losses; illuminated J-V curves; illuminated conditions; photovoltaic cells; reliability; series resistance power loss; Airports; Circuit testing; Current density; Electrical resistance measurement; Fabrication; Light sources; Lighting; Loss measurement; Photovoltaic cells; Textile industry;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
  • ISSN
    1060-8371
  • Print_ISBN
    0-7803-7471-1
  • Type

    conf

  • DOI
    10.1109/PVSC.2002.1190559
  • Filename
    1190559