DocumentCode
3342674
Title
Analysis of fill factor losses using current-voltage curves obtained under dark and illuminated conditions
Author
Hacke, P. ; Meier, D.L.
Author_Institution
EBARA Solar Inc., Vernon, PA, USA
fYear
2002
fDate
19-24 May 2002
Firstpage
462
Lastpage
464
Abstract
Series resistance was determined using illuminated and dark J-V curves for a group of twenty-eight cells. The change in fill factor due to the series resistance power loss was calculated and subtracted from the Suns-Voc-determined fill factor, which represents the fill factor void of series resistance losses. On average, this difference was found to equal the cell fill factor. This agreement indicates the reliability of each of the components involved in the determination. As a result, the fill factor losses due to series resistance using only dark and illuminated J-V measurements are determined with good accuracy. The limitations of this analysis are also discussed.
Keywords
current density; electric resistance; solar cells; Suns-Voc determined fill factor; accuracy; current-voltage curves; dark J-V curves; dark conditions; fill factor losses; illuminated J-V curves; illuminated conditions; photovoltaic cells; reliability; series resistance power loss; Airports; Circuit testing; Current density; Electrical resistance measurement; Fabrication; Light sources; Lighting; Loss measurement; Photovoltaic cells; Textile industry;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
ISSN
1060-8371
Print_ISBN
0-7803-7471-1
Type
conf
DOI
10.1109/PVSC.2002.1190559
Filename
1190559
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