DocumentCode
3342752
Title
CMOS circuits for on-chip capacitance ratio testing or sensor readout
Author
Cao, Yuming ; Temes, Gabor C.
Author_Institution
Dept. of Electr. & Comput. Eng., Oregon State Univ., Corvallis, OR, USA
Volume
3
fYear
1995
fDate
30 Apr-3 May 1995
Firstpage
1848
Abstract
Novel CMOS circuits are described for the on-chip measurement of capacitor ratios. They can provide a high-accuracy A/D interface for capacitive sensors, or allow the precise calibration of switched-capacitor DACs, amplifiers and other circuits utilizing ratioed capacitors
Keywords
CMOS integrated circuits; analogue-digital conversion; calibration; comparators (circuits); electric sensing devices; mixed analogue-digital integrated circuits; switched capacitor networks; CMOS circuits; calibration; capacitive sensors; high-accuracy A/D interface; mixed-mode circuits; on-chip capacitance ratio testing; ratioed capacitors; sensor readout; switched-capacitor DACs; Capacitance; Capacitive sensors; Circuit testing; Clocks; Digital integrated circuits; Feedback circuits; Operational amplifiers; Sensor phenomena and characterization; Switched capacitor circuits; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1995. ISCAS '95., 1995 IEEE International Symposium on
Conference_Location
Seattle, WA
Print_ISBN
0-7803-2570-2
Type
conf
DOI
10.1109/ISCAS.1995.523775
Filename
523775
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