Using impedance spectroscopy for enhanced capacitance-voltage measurements on solar cells with multiple space charge regions and a structured surface

Standard capacitance-voltage measurements for the investigation of doping profiles cannot be applied to devices with multiple space charge regions, e.g. multi junction solar cells. We present a method which utilizes impedance spectroscopy to extract capacitance-voltage characteristics for all space charge regions, simultaneously in one measurement. We demonstrate the usefulness of our method by showing the measurement results for laser processed Black Silicon Solar cells and discuss the related characterization issues.