Spatial coherency of the synchrotron radiation at the visible light region and its application for the electron beam profile measurement

Author

Mitsuhashi, Toshiyuki

Author_Institution

Inst. of Mater. Struct. Sci., High Energy Accel. Res. Organ., Ibaraki, Japan

Volume

1

fYear

1997

fDate

12-16 May 1997

Firstpage

766

Abstract

Spatial coherences of SR beam at visible light region were measured both σ and π-polarized components at Photon Factory. A wave-front division type polarized interferometer was designed and constructed for this experiment. Interferograms were observed clearly in the vertical direction. π phase difference of the interference fringe was observed between interferograms corresponding to σ and π-polarized components. Degree of spatial coherence was measured and by means of the van Citterut-Zernike´s theorem, a vertical beam profile was obtained by the Fourier transform of the degree of spatial coherence

Keywords

electron accelerators; light interferometry; particle beam diagnostics; storage rings; synchrotron radiation; Fourier transform; Photon Factory; electron beam profile measurement; interference fringe; interferograms; spatial coherence; spatial coherency; synchrotron radiation; van Citterut-Zernike´s theorem; vertical beam profile; visible light region; wave-front division type polarized interferometer; Band pass filters; Electron beams; Extraterrestrial measurements; Interference; Optical filters; Optical interferometry; Optical polarization; Particle beams; Spatial coherence; Synchrotron radiation;

fLanguage

English

Publisher

ieee

Conference_Titel

Particle Accelerator Conference, 1997. Proceedings of the 1997

Conference_Location

Vancouver, BC

Print_ISBN

0-7803-4376-X

Type

conf

DOI

10.1109/PAC.1997.749830

Filename

749830