• DocumentCode
    3342967
  • Title

    Cu(In,Ga)Se2 thin-film evolution during growth - a photoluminescence study

  • Author

    Keyes, Brian M. ; Dippo, P. ; Metzger, W. ; AbuShama, J. ; Noufi, Rommel

  • Author_Institution
    Nat. Renewable Energy Lab., Golden, CO, USA
  • fYear
    2002
  • fDate
    19-24 May 2002
  • Firstpage
    511
  • Lastpage
    514
  • Abstract
    An in-depth understanding of the defect formation and resulting changes in material quality occurring during the Cu(In,Ga)Se2 growth process is vital to the successful and widespread use of this photovoltaic material. In an attempt to develop such an understanding, we investigated the growth of Cu(In,Ga)Se2 thin films from (In,Ga)2Se3 precursors. This was achieved by using energy- and time-resolved photoluminescence spectroscopies to characterize a series of thin films, each removed at a different point along the reaction pathway of the "three-stage" growth process. The resulting thin films are representative of the absorber layer as it proceeds from a Cu-rich to Cu-poor state. The experimental results support a growth model incorporating changes in the dominant defect states and improvement in the recombination lifetime during this final stage of the growth process as the material transitions to a Cu-poor phase.
  • Keywords
    copper compounds; defect states; photoluminescence; radiative lifetimes; semiconductor growth; semiconductor thin films; spectral line shift; ternary semiconductors; time resolved spectra; vapour deposited coatings; (InGa)2Se3; Cu(In,Ga)Se2 thin-film evolution; Cu(InGa)Se2; defect formation; defect states; photoluminescence; photovoltaic material; recombination lifetime; three-stage growth; time-resolved photoluminescence; Laser excitation; Laser modes; Laser theory; Laser transitions; Optical materials; Phase change materials; Photoluminescence; Semiconductor laser arrays; Temperature; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
  • ISSN
    1060-8371
  • Print_ISBN
    0-7803-7471-1
  • Type

    conf

  • DOI
    10.1109/PVSC.2002.1190614
  • Filename
    1190614