DocumentCode :
3342967
Title :
Cu(In,Ga)Se2 thin-film evolution during growth - a photoluminescence study
Author :
Keyes, Brian M. ; Dippo, P. ; Metzger, W. ; AbuShama, J. ; Noufi, Rommel
Author_Institution :
Nat. Renewable Energy Lab., Golden, CO, USA
fYear :
2002
fDate :
19-24 May 2002
Firstpage :
511
Lastpage :
514
Abstract :
An in-depth understanding of the defect formation and resulting changes in material quality occurring during the Cu(In,Ga)Se2 growth process is vital to the successful and widespread use of this photovoltaic material. In an attempt to develop such an understanding, we investigated the growth of Cu(In,Ga)Se2 thin films from (In,Ga)2Se3 precursors. This was achieved by using energy- and time-resolved photoluminescence spectroscopies to characterize a series of thin films, each removed at a different point along the reaction pathway of the "three-stage" growth process. The resulting thin films are representative of the absorber layer as it proceeds from a Cu-rich to Cu-poor state. The experimental results support a growth model incorporating changes in the dominant defect states and improvement in the recombination lifetime during this final stage of the growth process as the material transitions to a Cu-poor phase.
Keywords :
copper compounds; defect states; photoluminescence; radiative lifetimes; semiconductor growth; semiconductor thin films; spectral line shift; ternary semiconductors; time resolved spectra; vapour deposited coatings; (InGa)2Se3; Cu(In,Ga)Se2 thin-film evolution; Cu(InGa)Se2; defect formation; defect states; photoluminescence; photovoltaic material; recombination lifetime; three-stage growth; time-resolved photoluminescence; Laser excitation; Laser modes; Laser theory; Laser transitions; Optical materials; Phase change materials; Photoluminescence; Semiconductor laser arrays; Temperature; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
ISSN :
1060-8371
Print_ISBN :
0-7803-7471-1
Type :
conf
DOI :
10.1109/PVSC.2002.1190614
Filename :
1190614
Link To Document :
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