• DocumentCode
    3343106
  • Title

    Numerical modeling of silicon nanocrystal down-shifting layers for enhanced CIGS solar cell performance

  • Author

    Gabr, Ahmed M. ; Walker, A. ; Trojnar, A. ; Hall, Trevor J. ; Kleiman, Rafael N. ; Hinzer, Karin

  • Author_Institution
    SUNLAB, Univ. of Ottawa, Ottawa, ON, Canada
  • fYear
    2013
  • fDate
    16-21 June 2013
  • Firstpage
    1003
  • Lastpage
    1007
  • Abstract
    The performance effects of silicon nanocrystals (SiNC) embedded in a silicon dioxide matrix to act as a downshifting (DS) layer mounted on the top surface of a polycrystalline Cu(In, Ga)Se2 solar cell are explored numerically. The DS layers are modeled by modifying the incident AM1.5G spectrum based on the absorption and emission properties of the SiNC. The effects of the DS layers as an anti-reflection coating leads to an 11.4% relative improvement in short-circuit current density under 1-sun illumination (0.1 W/cm2). Comparatively, the effect of down-shifting high-energy photons to lower energy photons showed a 4% relative short-circuit current density improvement, albeit for an optical conversion efficiency of 80%.
  • Keywords
    antireflection coatings; copper compounds; current density; elemental semiconductors; gallium compounds; indium compounds; nanostructured materials; semiconductor thin films; silicon; solar cells; CuInGaSe2; DS layer; Si; SiNC; absorption properties; antireflection coating; downshifting layer; emission properties; high-energy photons; incident AM1.5G spectrum; lower energy photons; polycrystalline CIGS solar cell; short-circuit current density; silicon dioxide matrix; silicon nanocrystals; Decision support systems; Numerical models; nanocrystals; photoluminescence; photovoltaic cells; silicon; solar energy; thin films;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
  • Conference_Location
    Tampa, FL
  • Type

    conf

  • DOI
    10.1109/PVSC.2013.6744310
  • Filename
    6744310