Mixed deterministic and pseudorandom test vector generator based on cellular automata structures

This paper proposes a new approach for designing a cost-effective on-chip Built-in Self-Test (BIST) generator through the use of Cellular Automata (CA) structures. The BIST generator thus designed is used to generate pseudorandom as well as deterministic test vectors. It is shown that no complex control logic is required to obtain either sequence. In addition, the resulting Test Vector Generator (TVG) is very efficient in terms of speed performances and is very regular and testable. Simulation of various benchmark circuits has given good results in terms of hardware size and test application time