DocumentCode
3343144
Title
Space charge accumulation and degradation in electron beam irradiated dielectrics for spacecraft
Author
Kikuchi, Yutaka ; Kashiwagi, Shuta ; Takada, Tatsuo ; Miyake, Hirokazu ; Tanaka, Yuichi
Author_Institution
Meas. & Electr. Machine Control Lab., Tokyo City Univ., Tokyo, Japan
fYear
2013
fDate
June 30 2013-July 4 2013
Firstpage
744
Lastpage
747
Abstract
Effect of electron beam irradiation on dielectric properties in various insulating materials for spacecraft is investigated using PEA (Pulsed Electro-Acoustic) method. In space environment, spacecraft is exposed to plasma or radioactive-rays. In such condition, multilayer insulating materials covering the spacecraft are charged up. Sometimes the charge accumulation causes to the serious damage to the electric devices and degradation of insulating materials. To investigate the change of the electrical properties of dielectrics by electron beam irradiation, we measure the space charge distributions and the conduction current in some e-beam irradiated materials under dc stress. From the measurement results, it was found that the large amount of charges accumulated in some irradiated materials under dc stress, while almost no charges accumulated in the non-irradiated materials under the same stress.
Keywords
aerospace materials; dielectric materials; electron beam effects; insulating materials; pulsed electroacoustic methods; space charge; space vehicles; PEA; conduction current; electron beam irradiated dielectrics; multilayer insulating materials; pulsed electro-acoustic method; radioactive rays; space charge accumulation; space charge degradation; space charge distributions; spacecraft; Anodes; Cathodes; Current measurement; Electric fields; Electron beams; Materials; Radiation effects; Conductivity; Electron Beam; Insulating Material; Space Charge;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid Dielectrics (ICSD), 2013 IEEE International Conference on
Conference_Location
Bologna
ISSN
2159-1687
Print_ISBN
978-1-4799-0807-3
Type
conf
DOI
10.1109/ICSD.2013.6619834
Filename
6619834
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