DocumentCode :
3343144
Title :
Space charge accumulation and degradation in electron beam irradiated dielectrics for spacecraft
Author :
Kikuchi, Yutaka ; Kashiwagi, Shuta ; Takada, Tatsuo ; Miyake, Hirokazu ; Tanaka, Yuichi
Author_Institution :
Meas. & Electr. Machine Control Lab., Tokyo City Univ., Tokyo, Japan
fYear :
2013
fDate :
June 30 2013-July 4 2013
Firstpage :
744
Lastpage :
747
Abstract :
Effect of electron beam irradiation on dielectric properties in various insulating materials for spacecraft is investigated using PEA (Pulsed Electro-Acoustic) method. In space environment, spacecraft is exposed to plasma or radioactive-rays. In such condition, multilayer insulating materials covering the spacecraft are charged up. Sometimes the charge accumulation causes to the serious damage to the electric devices and degradation of insulating materials. To investigate the change of the electrical properties of dielectrics by electron beam irradiation, we measure the space charge distributions and the conduction current in some e-beam irradiated materials under dc stress. From the measurement results, it was found that the large amount of charges accumulated in some irradiated materials under dc stress, while almost no charges accumulated in the non-irradiated materials under the same stress.
Keywords :
aerospace materials; dielectric materials; electron beam effects; insulating materials; pulsed electroacoustic methods; space charge; space vehicles; PEA; conduction current; electron beam irradiated dielectrics; multilayer insulating materials; pulsed electro-acoustic method; radioactive rays; space charge accumulation; space charge degradation; space charge distributions; spacecraft; Anodes; Cathodes; Current measurement; Electric fields; Electron beams; Materials; Radiation effects; Conductivity; Electron Beam; Insulating Material; Space Charge;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid Dielectrics (ICSD), 2013 IEEE International Conference on
Conference_Location :
Bologna
ISSN :
2159-1687
Print_ISBN :
978-1-4799-0807-3
Type :
conf
DOI :
10.1109/ICSD.2013.6619834
Filename :
6619834
Link To Document :
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