Title :
Wavefront distortion measurement of a SR extraction mirror for the beam profile monitor using Shack-Hartmann method
Author :
Takeuchi, N. ; Mitsuhashi, T. ; Itoh, M. ; Yatagai, T.
Author_Institution :
Inst. of Appl. Phys., Tsukuba Univ., Ibaraki, Japan
Abstract :
The wavefront measurement technique using the Shack-Hartmann wavefront sensor has been developed for measurement of wavefront distortion of a SR extraction mirror for the beam profile monitor at the Photon Factory. The instrument consists of a multi-lens array (8×8 array, 250 μm pitch and focal length of 4.5 mm), a beam expander (20:1), an image relay lens system (1:1), a He-Ne laser (633 nm) and a digital CCD camera. To analyze positions of focal spot on the CCD in 1/10 of the pixel size, the wave front sensor can measured to be λ/30. A dynamic range of the wavefront sensor was designed 12.6 μm max. Performance of the wavefront sensor was tested with an optical flat. With this wavefront sensor, a wavefront error caused by surface deformation of the SR extraction minor was measured at Beamline 27 of Photon Factory. The correction of the measured wavefront distortion is also described
Keywords :
electron accelerators; electron optics; particle beam diagnostics; storage rings; He-Ne laser; Photon Factory; Shack-Hartmann method; Shack-Hartmann wavefront sensor; beam profile monitor; digital CCD camera; image relay lens system; multi-lens array; surface deformation; synchrotron radiation extraction mirror; wavefront distortion measurement; wavefront measurement technique; Charge coupled devices; Distortion measurement; Laser beams; Mirrors; Optical arrays; Optical distortion; Optical sensors; Optoelectronic and photonic sensors; Production facilities; Strontium;
Conference_Titel :
Particle Accelerator Conference, 1997. Proceedings of the 1997
Conference_Location :
Vancouver, BC
Print_ISBN :
0-7803-4376-X
DOI :
10.1109/PAC.1997.749861
