• DocumentCode
    3343361
  • Title

    Comparison of experimental data with AMPS modeling of the effects of CdS layer thickness on the CdS/CdTe solar cell

  • Author

    Fahrenbruch, A.

  • Author_Institution
    ALF Inc., Redwood City, CA, USA
  • fYear
    2002
  • fDate
    19-24 May 2002
  • Firstpage
    583
  • Lastpage
    586
  • Abstract
    Prevailing wisdom has it that the CdS layer is dead with respect to photogeneration of carriers, acting only as an optical filter. This assumption is examined by comparison of experimental spectral response data with that obtained by AMPS simulation. AMPS layer thickness (XCdS) is small (∼0.1 μm), the layer could contribute several mA/cm2 of photogenerated current. The high electric field present in the CdS strongly decreases recombination losses in the bulk CdS and at the TCO/CdS and CdS/CdTe interfaces. The CdS layers theoretical contribution also depends critically on the carrier density there and on the conduction band discontinuity at the TCO/CdS interface. Removing the CdS layer from the model entirely causes Jsc, Voc and ff reductions, as observed experimentally, indicating that the effective recombination loss at the TCO/CdS Interface is much larger than that at the CdS/CdTe interface.
  • Keywords
    II-VI semiconductors; band structure; cadmium compounds; carrier density; photoconductivity; semiconductor device models; solar cells; 0.1 micron; AMPS modeling; CdS layer thickness; CdS-CdTe; CdS/CdTe solar cell; carrier density; conduction band discontinuity; photogenerated current; recombination loss; spectral response; Charge carrier density; Cities and towns; Neodymium; Optical filters; Optical losses; Photovoltaic cells; Predictive models; Radiative recombination; Semiconductor process modeling; Spontaneous emission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
  • ISSN
    1060-8371
  • Print_ISBN
    0-7803-7471-1
  • Type

    conf

  • DOI
    10.1109/PVSC.2002.1190632
  • Filename
    1190632