DocumentCode :
3343409
Title :
Key elements extraction based on particle feature and RBFNN in new meter calibration method
Author :
Zhao, Shutao ; Li, Baoshu ; Yuan, Jinsha ; Zhao, Dongsheng
Author_Institution :
Key Lab. of Power Syst. Protection & Dynamic Security Monitoring & Control, North China Electr. Power Univ., Baoding
fYear :
2005
fDate :
14-17 Dec. 2005
Firstpage :
795
Lastpage :
798
Abstract :
Imitating human´s ability of visual and analysis models, a computer vision-based measuring-instrument calibration method is proposed in this paper. Capturing meter images from real-time video with every analog output, via radial basis function neural network (RBFNN) to classify the dial plate elements, and meter reading can be obtained from complex needle movement. The particle feature extraction, RBFNN simple architecture and fast training process can satisfy the real-time meter reading perfectly in the needle identifier and reading recognition. The least squares fit method based on maximum likelihood estimate is efficient in needle parameter derivation, and the computer vision-based meter calibration method has high performance and accuracy
Keywords :
calibration; computer vision; feature extraction; image recognition; least squares approximations; maximum likelihood estimation; power engineering computing; power meters; radial basis function networks; RBFNN; computer vision; dial plate elements classification; feature extraction; key elements extraction; least squares fit method; maximum likelihood estimation; measuring-instrument calibration method; meter calibration method; meter images; needle identifier; particle feature; radial basis function neural network; reading recognition; real-time video; Calibration; Computer architecture; Computer vision; Feature extraction; High performance computing; Least squares approximation; Maximum likelihood estimation; Meter reading; Needles; Radial basis function networks;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Technology, 2005. ICIT 2005. IEEE International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
0-7803-9484-4
Type :
conf
DOI :
10.1109/ICIT.2005.1600744
Filename :
1600744
Link To Document :
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