• DocumentCode
    3343437
  • Title

    Optimal morphological filter design for fabric defect detection

  • Author

    Mak, K.L. ; Peng, P. ; Lau, H.Y.K.

  • Author_Institution
    Dept. of Ind. & Manuf. Syst. Eng., Hong Kong Univ.
  • fYear
    2005
  • fDate
    14-17 Dec. 2005
  • Firstpage
    799
  • Lastpage
    804
  • Abstract
    This paper investigates the problem of automated defect detection for textile fabrics and proposes a new optimal morphological filter design method for solving this problem. Gabor wavelet network (GWN) is adopted as a major technique to extract the texture features of textile fabrics. An optimal morphological filter can be constructed based on the texture features extracted. In view of this optimal filter, a new semi-supervised segmentation algorithm is then proposed. The performance of the scheme is evaluated by using a variety of homogeneous textile images with different types of common defects. The test results exhibit accurate defect detection with low false alarm, thus confirming the robustness and effectiveness of the proposed scheme. In addition, it can be shown that the algorithm proposed in this paper is suitable for on-line applications. Indeed, the proposed algorithm is a low cost PC based solution to the problem of defect detection for textile fabrics
  • Keywords
    Gabor filters; fabrics; feature extraction; flaw detection; image segmentation; inspection; wavelet transforms; Gabor wavelet network; automated defect detection; homogeneous textile images; optimal morphological filter; semisupervised segmentation algorithm; textile fabrics; texture features extraction; Costs; Design engineering; Fabrics; Feature extraction; Gabor filters; Inspection; Lubricating oils; Manufacturing industries; Manufacturing systems; Textile industry; Defect detection; Gabor wavelet networks; Mechatronics; Morphological filters; fabrics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Technology, 2005. ICIT 2005. IEEE International Conference on
  • Conference_Location
    Hong Kong
  • Print_ISBN
    0-7803-9484-4
  • Type

    conf

  • DOI
    10.1109/ICIT.2005.1600745
  • Filename
    1600745